Evan Olson

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Problem solving has always been a passion of mine. Regardless of the field of study I love learning new, exciting technologies and leveraging them to solve problems in new and unique ways. Creating has been a long standing common passion of many and can be one of the greatest pleasures in life. The cyclic nature of learning and creating is and always has been my greatest motivation.

Software Engineer & Problem Solver

  • State: New York
  • Degree: Bachelor of Science: Computer Science
  • Email: evan-ols@protonmail.com

Professional Experience

Software Development Technical Lead (Metrology)

Aug 2019 - Present

Corning Inc, Corning, NY

  • Currently leading and managing Corning IOX Metrology Software Engineering Team with 5 direct reports.
  • Led the complete redesign/rewrite of the all existing Metrology Software from .Net 4.6.1 to .netcore 3.1 WPF MVVM.
  • Developed, integrated and deployed a dynamic Machine Vision algorithm critical to production stress measurements.
  • Designed, built and deployed a Machine Vision Scratch Analysis algorithm.
  • Spearheaded the effort to create the next generation of Gorilla Glass post Ion-Exchange Metrology (hardware & software).
  • Led the training and setup and optimization for production stress measurement instruments.
  • Facilitated the deployment of Gitlab CI/CD to further improve my teams productivity.

Software Engineer II

Jun 2018 - Aug 2019

Corning Inc, Corning, NY

  • Worked with optical physicists to research and develop software to measure deep stress on chemically strengthened transparent substrates.
  • Built a Gitlab server and migrated existing SVN repos.
  • Revamped rapid prototyping introducing FDM 3D printers to our labs improving redesign turnaround time.
  • Designed and 3D modeled critical parts for experimental stress measurement hardware.


Bachelor of Science & Computer Science

2015 - 2017

SUNY Empire State College

Computer Science

2014 - 2015

SUNY University at Buffalo, Buffalo, NY

Associates of Applied Science & High Performance Computing

2011 - 2014

Corning Community College, Corning, NY

Associates of Science & Computer Science

2011 - 2014

Corning Community College, Corning, NY


Corning Inc.

The Individual

Evan - Thank you for all you do for the IOX Metrology team. Your leadership has proven to be foundational to our success in the delivering high quality software solutions, that ultimately enabled the sale of [Redacted] (a huge win for Corning). I really appreciate how you see a need and immediately take charge and act to find a solution. Your vision casting for where we should be with software development tools is enabling us to produce rapid deployments that have minimal risk for bugs. This is huge for our customers and gives us creditability with the metrology solutions we provide. Having you to lead the software development portion of the team and provide guidance to our developers has been a huge burden off my plate. You have really stepped up to the plate and demonstrated dedication and leadership. I can't wait to work with you again next year to deliver high-quality metrology solutions and solve problems for our customers. Thank you for everything you do for our team and Corning!!

Corning Inc.


Evan - Thank you for outstanding efforts in developing the ISM. Your leadership has been crucial in ISM software development, system integration, hardware troubleshooting and on-site testing/debug/validation. Thank you also for all your efforts in traveling to [Redacted] to ensure initial beta ISMs and software deployment was successful. Your leadership in driving the design and improvements in ISM will not only enable [Redacted] product [Redacted], but it also secures that future [Redacted] will be made and perform to specification. I also want to recognize the long hours, weekends and vacation time you have sacrificed to make the ISM and [Redacted] successful.

Corning Inc.


Thank you for your excellent support on very short notice to help with [Redacted] issues which were blocking [Redacted] ramp for [Redacted]. Thanks to your help, we solved several key technical challenges, improved the Corning IOXQC software, and ultimately enabled [Redacted] ramp to continue at [Redacted]. This work was critical for the business and has helped prove our technical expertise to a key customer. Thank you!!

Corning Inc.


[Redacted], [Redacted], and I would like to thank you for your leadership of the ISM team! The ISM team has worked extremely hard to develop our IOX Metrology tool that provides the capabilities of both [Redacted], allowing us to measure [Redacted] in the small footprint of a single unit, for use for [Redacted] and other products. This has included hardware design and troubleshooting, software development, signal collection and processing, system integration, and on-site testing/debug/validation to enable transfer to [Redacted] as system integrator for manufacturing equipment. The timeline for this highly complex metrology project was less than one year, and the first 30 units have been delivered, with many more expected. This not only enables [Redacted] to be on [Redacted], but also ensures that future [Redacted] will be made and perform to specification, and will also result in [Redacted]. The impact of this work will be enormous.

Corning Inc.


Evan, [Redacted], [Redacted] and I would like to thank you for your dedication and for the outstanding technical work that led to the launch of the first [Redacted].Thanks for the outstanding ISM deployment execution and for your commitment and dedication despite all the challenges this year. The work you did was essential for [Redacted] scale up and launch. The success of the program has been a significant contributor to the financial performance of the business in 2020. Thanks and congratulations!


Corning Inc.


Hybrid systems and methods for characterizing stress in chemically strengthened transparent substrates.

Andrews, r. c., bouzi, p. m., furnas, w. j., jacobson, j. r., newcomer, g. a., Olson, E. l., ... wetmore, n. d. (2021). u.s. patent no. 11,105,612. washington, dc: U.s. patent and trademark office. (n.d.).


Check out some of my side projects!

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New York State